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Dynamic Characterization of Thin Fil...

Gu, Wei.

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Dynamic Characterization of Thin Film Magnetic Materials.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Dynamic Characterization of Thin Film Magnetic Materials./
Author:	Gu, Wei.
Description:	51 p.
Notes:	Source: Masters Abstracts International, Volume: 55-04.
Contained By:	Masters Abstracts International55-04(E).
Subject:	Electrical engineering. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10119574
ISBN:	9781339808086

Dynamic Characterization of Thin Film Magnetic Materials.
Gu, Wei.

Dynamic Characterization of Thin Film Magnetic Materials. - 51 p.

Source: Masters Abstracts International, Volume: 55-04.

Thesis (M.S.)--University of California, Los Angeles, 2016.

A broadband dynamic method for characterizing thin film magnetic material is presented. The method is designed to extract the permeability and linewidth of thin magnetic films from measuring the reflection coefficient (S11) of a house-made and short-circuited strip line testing fixture with or without samples loaded. An adaptive de-embedding method is applied to remove the parasitic noise of the housing. The measurements were carried out with frequency up to 10GHz and biasing magnetic fields up to 600 Gauss. Particular measurement setup and 3-step experimental procedures are described in detail. The complex permeability of a 330nm thick continuous FeGaB, 435nm thick laminated FeGaB film and a 100nm thick NiFe film will be induced dynamically in frequency-biasing magnetic field spectra and compared with a theoretical model based on Landau-Lifshitz-Gilbert (LLG) equations and eddy current theories. The ferromagnetic resonance (FMR) phenomenon can be observed among these three magnetic materials investigated in this thesis.

ISBN: 9781339808086Subjects--Topical Terms:

649834
Electrical engineering.

Dynamic Characterization of Thin Film Magnetic Materials.
LDR:01875nmm a2200277 4500 001 2077274
005 20161114130246.5
008 170521s2016 ||||||||||||||||| ||eng d
020 $a 9781339808086
035 $a (MiAaPQ)AAI10119574
035 $a AAI10119574
040 $a MiAaPQ $c MiAaPQ
100 1 $a Gu, Wei. $3 3192775
245 1 0 $a Dynamic Characterization of Thin Film Magnetic Materials.
300 $a 51 p.
500 $a Source: Masters Abstracts International, Volume: 55-04.
500 $a Adviser: Yuanxun Wang.
502 $a Thesis (M.S.)--University of California, Los Angeles, 2016.
520 $a A broadband dynamic method for characterizing thin film magnetic material is presented. The method is designed to extract the permeability and linewidth of thin magnetic films from measuring the reflection coefficient (S11) of a house-made and short-circuited strip line testing fixture with or without samples loaded. An adaptive de-embedding method is applied to remove the parasitic noise of the housing. The measurements were carried out with frequency up to 10GHz and biasing magnetic fields up to 600 Gauss. Particular measurement setup and 3-step experimental procedures are described in detail. The complex permeability of a 330nm thick continuous FeGaB, 435nm thick laminated FeGaB film and a 100nm thick NiFe film will be induced dynamically in frequency-biasing magnetic field spectra and compared with a theoretical model based on Landau-Lifshitz-Gilbert (LLG) equations and eddy current theories. The ferromagnetic resonance (FMR) phenomenon can be observed among these three magnetic materials investigated in this thesis.
590 $a School code: 0031.
650 4 $a Electrical engineering. $3 649834
650 4 $a Electromagnetics. $3 3173223
690 $a 0544
690 $a 0607
710 2 $a University of California, Los Angeles. $b Electrical Engineering. $3 2094815
773 0 $t Masters Abstracts International $g 55-04(E).
790 $a 0031
791 $a M.S.
792 $a 2016
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=10119574