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Thin-film Interference for Surface P...

Wang, Chu.

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Thin-film Interference for Surface Plasmon Resonance System and Ultra-thin Film Ultraviolet Super Absorber Structure.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Thin-film Interference for Surface Plasmon Resonance System and Ultra-thin Film Ultraviolet Super Absorber Structure./
Author:	Wang, Chu.
Description:	68 p.
Notes:	Source: Masters Abstracts International, Volume: 53-04.
Contained By:	Masters Abstracts International53-04(E).
Subject:	Electrical engineering. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1561679
ISBN:	9781321072822

Thin-film Interference for Surface Plasmon Resonance System and Ultra-thin Film Ultraviolet Super Absorber Structure.
Wang, Chu.

Thin-film Interference for Surface Plasmon Resonance System and Ultra-thin Film Ultraviolet Super Absorber Structure. - 68 p.

Source: Masters Abstracts International, Volume: 53-04.

Thesis (M.S.)--State University of New York at Buffalo, 2014.

This item must not be sold to any third party vendors.

Thin-film interference is the basic mechanism of surface plasmon resonance system and ultra-thin film ultraviolet super absorber structure. In optical interference, the reflection and refraction of light occurred between two media with different refractive indices can be described by Fresnel's equations. In this thesis, a conventional surface plasmon resonance (SPR) system and an ultra-thin film device capable of highly absorbing light in the ultraviolet (UV) spectral range were both designed using Fresnel's equations and numerically simulated using COMSOL Multiphysics finite-element-based electromagnetics solver. Experimental results were then presented to validate analytical and numerical modeling.

ISBN: 9781321072822Subjects--Topical Terms:

649834
Electrical engineering.

Thin-film Interference for Surface Plasmon Resonance System and Ultra-thin Film Ultraviolet Super Absorber Structure.
LDR:01679nmm a2200289 4500 001 2062491
005 20151027073328.5
008 170521s2014 ||||||||||||||||| ||eng d
020 $a 9781321072822
035 $a (MiAaPQ)AAI1561679
035 $a AAI1561679
040 $a MiAaPQ $c MiAaPQ
100 1 $a Wang, Chu. $3 3176877
245 1 0 $a Thin-film Interference for Surface Plasmon Resonance System and Ultra-thin Film Ultraviolet Super Absorber Structure.
300 $a 68 p.
500 $a Source: Masters Abstracts International, Volume: 53-04.
500 $a Adviser: Qiaoqiang Gan.
502 $a Thesis (M.S.)--State University of New York at Buffalo, 2014.
506 $a This item must not be sold to any third party vendors.
520 $a Thin-film interference is the basic mechanism of surface plasmon resonance system and ultra-thin film ultraviolet super absorber structure. In optical interference, the reflection and refraction of light occurred between two media with different refractive indices can be described by Fresnel's equations. In this thesis, a conventional surface plasmon resonance (SPR) system and an ultra-thin film device capable of highly absorbing light in the ultraviolet (UV) spectral range were both designed using Fresnel's equations and numerically simulated using COMSOL Multiphysics finite-element-based electromagnetics solver. Experimental results were then presented to validate analytical and numerical modeling.
590 $a School code: 0656.
650 4 $a Electrical engineering. $3 649834
650 4 $a Optics. $3 517925
690 $a 0544
690 $a 0752
710 2 $a State University of New York at Buffalo. $b Electrical Engineering. $3 1019366
773 0 $t Masters Abstracts International $g 53-04(E).
790 $a 0656
791 $a M.S.
792 $a 2014
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=1561679