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Traceable and Precise Displacement M...

Koulakis, John Pandelis.

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Traceable and Precise Displacement Measurements with Microwave Cavities.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Traceable and Precise Displacement Measurements with Microwave Cavities./
Author:	Koulakis, John Pandelis.
Description:	192 p.
Notes:	Source: Dissertation Abstracts International, Volume: 75-08(E), Section: B.
Contained By:	Dissertation Abstracts International75-08B(E).
Subject:	Physics, Atomic. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3613952
ISBN:	9781303779084

Traceable and Precise Displacement Measurements with Microwave Cavities.
Koulakis, John Pandelis.

Traceable and Precise Displacement Measurements with Microwave Cavities. - 192 p.

Source: Dissertation Abstracts International, Volume: 75-08(E), Section: B.

Thesis (Ph.D.)--University of California, Los Angeles, 2014.

This item must not be sold to any third party vendors.

The difficulty of making accurate, repeatable, sub-nanometer displacement measurements has limited the progress of nanotechnology and surface science. Scanning probe microscopy, an important set of tools for characterizing nanoscale structures, is capable of atomic resolution imaging, but has yet to realize its full, metrological potential. This work evaluates the feasibility of using microwave cavities to address this need. Accurate and stable RF frequency references have become ubiquitous and are an attractive option for realizing traceable distance measurements through the resonant frequency of microwave cavities operating in TEM modes. A method of measuring the resonant frequency of such cavities capable of sensing picometer displacements is developed. The concept is demonstrated with a variable-length, 10 GHz coaxial cavity, and proves to have a resolution of 60 fm Hz-1/2, and a range of 10 mum. Independent measurements with an interferometer verify that the device is capable of displacement measurements accurate to 1% without external calibration, and with non-linearity <5x10-4 of the measured range. Appropriate mechanical design can extend the range and improve the accuracy. Incorporating this system into scanning probe microscopes would allow them to measure sub-atomic distances confidently.

ISBN: 9781303779084Subjects--Topical Terms:

1029235
Physics, Atomic.

Traceable and Precise Displacement Measurements with Microwave Cavities.
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020 $a 9781303779084
035 $a (MiAaPQ)AAI3613952
035 $a AAI3613952
040 $a MiAaPQ $c MiAaPQ
100 1 $a Koulakis, John Pandelis. $3 3171198
245 1 0 $a Traceable and Precise Displacement Measurements with Microwave Cavities.
300 $a 192 p.
500 $a Source: Dissertation Abstracts International, Volume: 75-08(E), Section: B.
500 $a Adviser: Karoly Holczer.
502 $a Thesis (Ph.D.)--University of California, Los Angeles, 2014.
506 $a This item must not be sold to any third party vendors.
520 $a The difficulty of making accurate, repeatable, sub-nanometer displacement measurements has limited the progress of nanotechnology and surface science. Scanning probe microscopy, an important set of tools for characterizing nanoscale structures, is capable of atomic resolution imaging, but has yet to realize its full, metrological potential. This work evaluates the feasibility of using microwave cavities to address this need. Accurate and stable RF frequency references have become ubiquitous and are an attractive option for realizing traceable distance measurements through the resonant frequency of microwave cavities operating in TEM modes. A method of measuring the resonant frequency of such cavities capable of sensing picometer displacements is developed. The concept is demonstrated with a variable-length, 10 GHz coaxial cavity, and proves to have a resolution of 60 fm Hz-1/2, and a range of 10 mum. Independent measurements with an interferometer verify that the device is capable of displacement measurements accurate to 1% without external calibration, and with non-linearity <5x10-4 of the measured range. Appropriate mechanical design can extend the range and improve the accuracy. Incorporating this system into scanning probe microscopes would allow them to measure sub-atomic distances confidently.
590 $a School code: 0031.
650 4 $a Physics, Atomic. $3 1029235
650 4 $a Engineering, Electronics and Electrical. $3 626636
690 $a 0748
690 $a 0544
710 2 $a University of California, Los Angeles. $b Physics 0666. $3 3171199
773 0 $t Dissertation Abstracts International $g 75-08B(E).
790 $a 0031
791 $a Ph.D.
792 $a 2014
793 $a English
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3613952