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X-ray and neutron techniques for nan...
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Kumar, Challa S. S. R.
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X-ray and neutron techniques for nanomaterials characterization
Record Type:
Electronic resources : Monograph/item
Title/Author:
X-ray and neutron techniques for nanomaterials characterization/ edited by Challa S. S. R. Kumar.
other author:
Kumar, Challa S. S. R.
Published:
Berlin, Heidelberg :Springer Berlin Heidelberg : : 2016.,
Description:
x, 830 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:
Synchrotron X-ray phase nano-tomography for bone tissue characterization -- 3D chemical imaging of nanoscale biological, environmental, and synthetic materials by soft X-ray STXM spectro-tomography -- X-ray photon correlation spectroscopy for the characterization of soft and hard condensed matter -- XAFS for characterization of nanomaterials -- The characterization of atomically precise nano clusters using X-ray absorption spectroscopy -- X-ray absorption spectroscopic characterization of nanomaterial catalysts in electrochemistry and fuel cells -- In situ SXS and XAFS measurements of electrochemical interface -- Gas-phase near-edge X-ray absorption fine structure (NEXAFS) spectroscopy of nanoparticles, biopolymers, and ionic species -- In situ X-ray reciprocal space mapping for characterization of nanomaterials -- X-ray powder diffraction characterization of nanomaterials -- X-ray absorption fine structure analysis of catalytic nanomaterials -- Contribution of small angle X-ray and neutron scattering (SAXS & SANS) to the characterization of natural nano-materials -- Synchrotron small-angle X-ray scattering and small-angle neutron scattering studies of nanomaterials -- Quasi-elastic neutron scattering: An advanced technique for studying the relaxation processes in condensed matter.
Contained By:
Springer eBooks
Subject:
Nanostructured materials - Analysis. -
Online resource:
http://dx.doi.org/10.1007/978-3-662-48606-1
ISBN:
9783662486061
X-ray and neutron techniques for nanomaterials characterization
X-ray and neutron techniques for nanomaterials characterization
[electronic resource] /edited by Challa S. S. R. Kumar. - Berlin, Heidelberg :Springer Berlin Heidelberg :2016. - x, 830 p. :ill. (some col.), digital ;24 cm.
Synchrotron X-ray phase nano-tomography for bone tissue characterization -- 3D chemical imaging of nanoscale biological, environmental, and synthetic materials by soft X-ray STXM spectro-tomography -- X-ray photon correlation spectroscopy for the characterization of soft and hard condensed matter -- XAFS for characterization of nanomaterials -- The characterization of atomically precise nano clusters using X-ray absorption spectroscopy -- X-ray absorption spectroscopic characterization of nanomaterial catalysts in electrochemistry and fuel cells -- In situ SXS and XAFS measurements of electrochemical interface -- Gas-phase near-edge X-ray absorption fine structure (NEXAFS) spectroscopy of nanoparticles, biopolymers, and ionic species -- In situ X-ray reciprocal space mapping for characterization of nanomaterials -- X-ray powder diffraction characterization of nanomaterials -- X-ray absorption fine structure analysis of catalytic nanomaterials -- Contribution of small angle X-ray and neutron scattering (SAXS & SANS) to the characterization of natural nano-materials -- Synchrotron small-angle X-ray scattering and small-angle neutron scattering studies of nanomaterials -- Quasi-elastic neutron scattering: An advanced technique for studying the relaxation processes in condensed matter.
Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
ISBN: 9783662486061
Standard No.: 10.1007/978-3-662-48606-1doiSubjects--Topical Terms:
1532094
Nanostructured materials
--Analysis.
LC Class. No.: QC176.8.N35
Dewey Class. No.: 620.115
X-ray and neutron techniques for nanomaterials characterization
LDR
:02725nmm a2200325 a 4500
001
2053535
003
DE-He213
005
20161013162755.0
006
m d
007
cr nn 008maaau
008
170510s2016 gw s 0 eng d
020
$a
9783662486061
$q
(electronic bk.)
020
$a
9783662486047
$q
(paper)
024
7
$a
10.1007/978-3-662-48606-1
$2
doi
035
$a
978-3-662-48606-1
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
QC176.8.N35
072
7
$a
TBN
$2
bicssc
072
7
$a
TEC027000
$2
bisacsh
072
7
$a
SCI050000
$2
bisacsh
082
0 4
$a
620.115
$2
23
090
$a
QC176.8.N35
$b
X1 2016
245
0 0
$a
X-ray and neutron techniques for nanomaterials characterization
$h
[electronic resource] /
$c
edited by Challa S. S. R. Kumar.
260
$a
Berlin, Heidelberg :
$b
Springer Berlin Heidelberg :
$b
Imprint: Springer,
$c
2016.
300
$a
x, 830 p. :
$b
ill. (some col.), digital ;
$c
24 cm.
505
0
$a
Synchrotron X-ray phase nano-tomography for bone tissue characterization -- 3D chemical imaging of nanoscale biological, environmental, and synthetic materials by soft X-ray STXM spectro-tomography -- X-ray photon correlation spectroscopy for the characterization of soft and hard condensed matter -- XAFS for characterization of nanomaterials -- The characterization of atomically precise nano clusters using X-ray absorption spectroscopy -- X-ray absorption spectroscopic characterization of nanomaterial catalysts in electrochemistry and fuel cells -- In situ SXS and XAFS measurements of electrochemical interface -- Gas-phase near-edge X-ray absorption fine structure (NEXAFS) spectroscopy of nanoparticles, biopolymers, and ionic species -- In situ X-ray reciprocal space mapping for characterization of nanomaterials -- X-ray powder diffraction characterization of nanomaterials -- X-ray absorption fine structure analysis of catalytic nanomaterials -- Contribution of small angle X-ray and neutron scattering (SAXS & SANS) to the characterization of natural nano-materials -- Synchrotron small-angle X-ray scattering and small-angle neutron scattering studies of nanomaterials -- Quasi-elastic neutron scattering: An advanced technique for studying the relaxation processes in condensed matter.
520
$a
Fifth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about X-ray and Neutron Techniques for Nanomaterials Characterization. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
650
0
$a
Nanostructured materials
$x
Analysis.
$3
1532094
650
0
$a
Nanochemistry.
$3
813421
650
1 4
$a
Materials Science.
$3
890867
650
2 4
$a
Nanotechnology.
$3
526235
650
2 4
$a
Spectroscopy/Spectrometry.
$3
1084899
700
1
$a
Kumar, Challa S. S. R.
$3
1568951
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer eBooks
856
4 0
$u
http://dx.doi.org/10.1007/978-3-662-48606-1
950
$a
Chemistry and Materials Science (Springer-11644)
based on 0 review(s)
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W9286838
電子資源
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EB QC176.8.N35
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