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Advances in imaging and electron phy...

Hawkes, Peter W.

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Advances in imaging and electron physics /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Advances in imaging and electron physics // editor-in-chief, Peter W. Hawkes.
other author:	Hawkes, Peter W.
Published:	Amsterdam :Academic Press, : 2012-.,
Description:	v. :ill. ;24 cm.
Subject:	Electrons. -
ISBN:	9780123942982 (hbk.) :
ISSN:	10765670

Advances in imaging and electron physics /
Advances in imaging and electron physics /editor-in-chief, Peter W. Hawkes. - Amsterdam :Academic Press,2012-. - v. :ill. ;24 cm. - Advances in imaging and electron physics.

Includes bibliographical references and index.

v. 174 : Silicon-based millimeter-wave technology : measurement, modeling and applications /

Advances in Imaging and Electron Physics features cutting- edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.

ISBN: 9780123942982 (hbk.) :US490.00 (2 vol.) (v. 174)

ISSN: 10765670Subjects--Topical Terms:

516581
Electrons.

LC Class. No.: QC793.5.E62 / A3

Advances in imaging and electron physics /
LDR:02684cam a2200601 a 4500 001 1869285
008 130704m20129999ne b 001 0 eng d
020 $a 9780123942982 (hbk.) : $c US490.00 (2 vol.) (v. 174)
020 $a 0123942985 (hbk.) (v.174)
020 $a 9780123946362 (ebk.) (v.174)
020 $a 0123946360 (ebk.) (v.174)
020 $a 9780124077027 (hbk.) : $c US490.00 (2 vol.) (v. 177)
020 $a 0124077028 (hbk.) (v. 177)
020 $a 9780124077300 (ebk.) (v. 177)
020 $a 0124077307 (ebk.) (v. 177)
020 $a 9780120147755 (v.133)
020 $a 9780120147831 (v.141)
020 $a 9780123742186 (v.151)
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020 $a 9780123859853 (v. 167)
020 $a 9780123859839 (v. 168)
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020 $a 9780123943965 (v. 170)
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020 $a 9780123969699 (v. 173)
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020 $a 9780124081420 (v. 176)
020 $a 9780124077010 (v. 178)
020 $a 9780124077003 (v. 179)
022 # $a 10765670
035 $a PS-BW-102-N-06
040 $a N$T $c N$T $d OPELS
050 0 0 $a QC793.5.E62 $b A3
245 1 0 $a Advances in imaging and electron physics / $c editor-in-chief, Peter W. Hawkes.
260 # $a Amsterdam : $b Academic Press, $c 2012-.
300 $a v. : $b ill. ; $c 24 cm.
490 1 0 $a Advances in imaging and electron physics
504 $a Includes bibliographical references and index.
505 0 # $t v. 174 : Silicon-based millimeter-wave technology : measurement, modeling and applications / $c guest editor M. Jamal Deen -- $t v. 177 / $c edited by Peter W. Hawkes.
520 # $a Advances in Imaging and Electron Physics features cutting- edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
650 # 0 $a Electrons. $3 516581
650 # 0 $a Image processing. $3 621117
650 # 0 $a Electronics. $3 517156
650 # 0 $a Optoelectronic devices. $3 535872
650 # 0 $a Optical data processing. $3 649747
700 1 # $a Hawkes, Peter W. $3 1982370
740 0 2 $a Silicon-based millimeter-wave technology.