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Investigation of advanced phase-shif...

Liu, Hongyu.

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Investigation of advanced phase-shifting projected fringe profilometry techniques.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Investigation of advanced phase-shifting projected fringe profilometry techniques./
Author:	Liu, Hongyu.
Description:	199 p.
Notes:	Source: Dissertation Abstracts International, Volume: 60-08, Section: B, page: 4129.
Contained By:	Dissertation Abstracts International60-08B.
Subject:	Engineering, Electronics and Electrical. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9940896
ISBN:	0599424354

Investigation of advanced phase-shifting projected fringe profilometry techniques.
Liu, Hongyu.

Investigation of advanced phase-shifting projected fringe profilometry techniques. - 199 p.

Source: Dissertation Abstracts International, Volume: 60-08, Section: B, page: 4129.

Thesis (Ph.D.)--The Pennsylvania State University, 1999.

The phase-shifting projected fringe profilometry (PSPFP) technique is a powerful tool in the profile measurements of rough engineering surfaces. Compared with other competing techniques, this technique is notable for its full-field measurement capacity, system simplicity, high measurement speed, and low environmental vulnerability. The main purpose of this dissertation is to tackle three important problems, which severely limit the capability and the accuracy of the PSPFP technique, with some new approaches.

ISBN: 0599424354Subjects--Topical Terms:

626636
Engineering, Electronics and Electrical.

Investigation of advanced phase-shifting projected fringe profilometry techniques.
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020 $a 0599424354
035 $a (UnM)AAI9940896
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100 1 $a Liu, Hongyu. $3 1929896
245 1 0 $a Investigation of advanced phase-shifting projected fringe profilometry techniques.
300 $a 199 p.
500 $a Source: Dissertation Abstracts International, Volume: 60-08, Section: B, page: 4129.
500 $a Adviser: Francis T. S. Yu.
502 $a Thesis (Ph.D.)--The Pennsylvania State University, 1999.
520 $a The phase-shifting projected fringe profilometry (PSPFP) technique is a powerful tool in the profile measurements of rough engineering surfaces. Compared with other competing techniques, this technique is notable for its full-field measurement capacity, system simplicity, high measurement speed, and low environmental vulnerability. The main purpose of this dissertation is to tackle three important problems, which severely limit the capability and the accuracy of the PSPFP technique, with some new approaches.
520 $a Chapter 1 provides some background information of the PSPFP technique including the measurement principles, basic features, and related techniques is briefly introduced. The objectives and organization of the thesis are also outlined.
520 $a Chapter 2 gives a theoretical treatment to the absolute PSPFP measurement. The mathematical formulations and basic requirements of the absolute PSPFP measurement and its supporting techniques are discussed in detail.
520 $a Chapter 3 introduces the experimental verification of the proposed absolute PSPFP technique. Some design details of a prototype system are discussed as supplements to the previous theoretical analysis. Various fundamental experiments performed for concept verification and accuracy evaluation are introduced together with some brief comments.
520 $a Chapter 4 presents the theoretical study of speckle-induced phase measurement errors. In this analysis, the expression for speckle-induced phase errors is first derived based on the multiplicative noise model of image-plane speckles. The statistics and the system dependence of speckle-induced phase errors are then thoroughly studied through numerical simulations and analytical derivations. Based on the analysis, some suggestions on the system design are given to improve measurement accuracy.
520 $a Chapter 5 discusses a new technique combating surface reflectivity variations. The formula used for error compensation is first derived based on a simplified model of the detection process. The techniques coping with two major effects of surface reflectivity variations are then introduced. Some fundamental problems in the proposed technique are studied through simulations.
520 $a Chapter 6 briefly summarizes the major contributions of the current work and provides some suggestions for the future research.
590 $a School code: 0176.
650 4 $a Engineering, Electronics and Electrical. $3 626636
650 4 $a Physics, Optics. $3 1018756
690 $a 0544
690 $a 0752
710 2 0 $a The Pennsylvania State University. $3 699896
773 0 $t Dissertation Abstracts International $g 60-08B.
790 1 0 $a Yu, Francis T. S., $e advisor
790 $a 0176
791 $a Ph.D.
792 $a 1999
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9940896