Charge transport and contact effects...
Beebe, Jeremy Matthew.

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  • Charge transport and contact effects in nanoscale electrical junctions formed via conducting probe atomic force microscopy.
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Charge transport and contact effects in nanoscale electrical junctions formed via conducting probe atomic force microscopy./
    Author: Beebe, Jeremy Matthew.
    Description: 171 p.
    Notes: Source: Dissertation Abstracts International, Volume: 65-12, Section: B, page: 6347.
    Contained By: Dissertation Abstracts International65-12B.
    Subject: Chemistry, General. -
    Online resource: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3156766
    ISBN: 0496174576
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