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A unified approach to X-ray absorpti...

Oltulu, Oral.

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A unified approach to X-ray absorption-refraction-extinction contrast with diffraction-enhanced imaging.

Record Type:	Electronic resources : Monograph/item
Title/Author:	A unified approach to X-ray absorption-refraction-extinction contrast with diffraction-enhanced imaging./
Author:	Oltulu, Oral.
Description:	106 p.
Notes:	Source: Dissertation Abstracts International, Volume: 64-04, Section: B, page: 1763.
Contained By:	Dissertation Abstracts International64-04B.
Subject:	Physics, General. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3087854
ISBN:	0496356167

A unified approach to X-ray absorption-refraction-extinction contrast with diffraction-enhanced imaging.
Oltulu, Oral.

A unified approach to X-ray absorption-refraction-extinction contrast with diffraction-enhanced imaging. - 106 p.

Source: Dissertation Abstracts International, Volume: 64-04, Section: B, page: 1763.

Thesis (Ph.D.)--Illinois Institute of Technology, 2003.

The purpose of this study was to explore the potential of Diffraction Enhanced Imaging (DEI). Diffraction enhanced Imaging (DEI) is a recently developed imaging technique for radiography. The technique (DEI) utilizes a silicon crystal placed between the sample and the detector. The angular sensitivity of the crystal allows measuring the x-ray attenuation of the sample, the gradient of x-ray refraction, and rejection for the ultra-small angle scattering. The new method provides a way of imaging these contrast mechanisms. The DEI presents two images. The introduced images by DEI are apparent absorption and refraction images. Apparent absorption is a combined contrast due to extinction and absorption. Extinction contrast is a result of scatter rejection by the crystal. This study focuses on these contrast mechanisms and considers them separately. The new contrast mechanisms are used to present true absorption, refraction, extinction and scatter width images. This study also gives a much better description for refraction images and offers solutions to minimize image blurring due to refraction aberration effect.

ISBN: 0496356167Subjects--Topical Terms:

1018488
Physics, General.

A unified approach to X-ray absorption-refraction-extinction contrast with diffraction-enhanced imaging.
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100 1 $a Oltulu, Oral. $3 1926811
245 1 2 $a A unified approach to X-ray absorption-refraction-extinction contrast with diffraction-enhanced imaging.
300 $a 106 p.
500 $a Source: Dissertation Abstracts International, Volume: 64-04, Section: B, page: 1763.
500 $a Adviser: Leroy Dean Chapman.
502 $a Thesis (Ph.D.)--Illinois Institute of Technology, 2003.
520 $a The purpose of this study was to explore the potential of Diffraction Enhanced Imaging (DEI). Diffraction enhanced Imaging (DEI) is a recently developed imaging technique for radiography. The technique (DEI) utilizes a silicon crystal placed between the sample and the detector. The angular sensitivity of the crystal allows measuring the x-ray attenuation of the sample, the gradient of x-ray refraction, and rejection for the ultra-small angle scattering. The new method provides a way of imaging these contrast mechanisms. The DEI presents two images. The introduced images by DEI are apparent absorption and refraction images. Apparent absorption is a combined contrast due to extinction and absorption. Extinction contrast is a result of scatter rejection by the crystal. This study focuses on these contrast mechanisms and considers them separately. The new contrast mechanisms are used to present true absorption, refraction, extinction and scatter width images. This study also gives a much better description for refraction images and offers solutions to minimize image blurring due to refraction aberration effect.
590 $a School code: 0091.
650 4 $a Physics, General. $3 1018488
650 4 $a Physics, Radiation. $3 1019212
650 4 $a Biophysics, Medical. $3 1017681
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690 $a 0760
710 2 0 $a Illinois Institute of Technology. $3 1018749
773 0 $t Dissertation Abstracts International $g 64-04B.
790 1 0 $a Chapman, Leroy Dean, $e advisor
790 $a 0091
791 $a Ph.D.
792 $a 2003
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3087854