Reliability quantification of printe...
Wei, Zishan.

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  • Reliability quantification of printed circuit boards subjected to thermal and vibration loads.
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Reliability quantification of printed circuit boards subjected to thermal and vibration loads./
    Author: Wei, Zishan.
    Description: 265 p.
    Notes: Source: Dissertation Abstracts International, Volume: 65-12, Section: B, page: 6629.
    Contained By: Dissertation Abstracts International65-12B.
    Subject: Engineering, Electronics and Electrical. -
    Online resource: http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3158166
    ISBN: 9780496907809
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