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Edge based finite element simulation...

Li, Yue.

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Edge based finite element simulation of eddy current phenomenon and its application to defect characterization.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Edge based finite element simulation of eddy current phenomenon and its application to defect characterization./
Author:	Li, Yue.
Description:	133 p.
Notes:	Source: Dissertation Abstracts International, Volume: 63-08, Section: B, page: 3847.
Contained By:	Dissertation Abstracts International63-08B.
Subject:	Engineering, Electronics and Electrical. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3061841
ISBN:	0493778195

Edge based finite element simulation of eddy current phenomenon and its application to defect characterization.
Li, Yue.

Edge based finite element simulation of eddy current phenomenon and its application to defect characterization. - 133 p.

Source: Dissertation Abstracts International, Volume: 63-08, Section: B, page: 3847.

Thesis (Ph.D.)--Iowa State University, 2002.

Edge based finite elements are finite elements whose degrees of freedom are assigned to edges of finite elements rather than nodes. Compared with conventional node based counterparts, they offer many useful properties. For example, they enforce tangential continuity only on inter-element boundaries but no normal continuity; they allow a vector field separated as the sum of the gradient of a scalar function and the remaining part. This dissertation presents a magnetic vector potential formulation implemented with edge elements to simulate eddy current phenomenon. The additional degree of freedom associated with the magnetic vector potential is fixed with the help of tree and co-tree separation from graph theory. The validity of the method is verified using well-known benchmark problems.

ISBN: 0493778195Subjects--Topical Terms:

626636
Engineering, Electronics and Electrical.

Edge based finite element simulation of eddy current phenomenon and its application to defect characterization.
LDR:02598nmm 2200277 4500 001 1810651
005 20040329092832.5
008 130610s2002 eng d
020 $a 0493778195
035 $a (UnM)AAI3061841
035 $a AAI3061841
040 $a UnM $c UnM
100 1 $a Li, Yue. $3 1900255
245 1 0 $a Edge based finite element simulation of eddy current phenomenon and its application to defect characterization.
300 $a 133 p.
500 $a Source: Dissertation Abstracts International, Volume: 63-08, Section: B, page: 3847.
500 $a Major Professor: Satish Udpa.
502 $a Thesis (Ph.D.)--Iowa State University, 2002.
520 $a Edge based finite elements are finite elements whose degrees of freedom are assigned to edges of finite elements rather than nodes. Compared with conventional node based counterparts, they offer many useful properties. For example, they enforce tangential continuity only on inter-element boundaries but no normal continuity; they allow a vector field separated as the sum of the gradient of a scalar function and the remaining part. This dissertation presents a magnetic vector potential formulation implemented with edge elements to simulate eddy current phenomenon. The additional degree of freedom associated with the magnetic vector potential is fixed with the help of tree and co-tree separation from graph theory. The validity of the method is verified using well-known benchmark problems.
520 $a A phenomenological signal inversion scheme is proposed to characterize defect profiles from eddy current probe signals. The method relies on the edge element based forward model to predict probe responses and a minimization algorithm to minimize an objective function representing the squared error between the modal prediction and the observed signal. A gradient-based minimization algorithm is first investigated. The long computation time associated with the gradient calculation is reduced using the adjoint equation based method. However, gradient-based methods tend to converge to a poorer local minimum. A genetic algorithm and a simulated annealing algorithm are employed to improve performance. The performance of these stochastic methods in the context of the defect characterization problem is studied. The preliminary results show the effectiveness of the stochastic methods.
590 $a School code: 0097.
650 4 $a Engineering, Electronics and Electrical. $3 626636
690 $a 0544
710 2 0 $a Iowa State University. $3 1017855
773 0 $t Dissertation Abstracts International $g 63-08B.
790 1 0 $a Udpa, Satish, $e advisor
790 $a 0097
791 $a Ph.D.
792 $a 2002
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=3061841