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Characterization of High Tc Material...

Browning, Nigel D.

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Characterization of High Tc Materials and Devices by Electron Microscopy.

Record Type:	Electronic resources : Monograph/item
Title/Author:	Characterization of High Tc Materials and Devices by Electron Microscopy./
Author:	Browning, Nigel D.
other author:	Pennycook, Stephen J.
Published:	Cambridge :Cambridge University Press, : 2000.,
Description:	407 p.
[NT 15003449]:	Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
[NT 15003449]:	9 Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O710 Grain boundaries in high T materials: transport properties and structure; 11 The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7-Delta; 12 Microstructures in superconducting YBa2Cu3O7 thin films; 13 Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron...; 14 Controlling the structure and properties of high T thin-film dev
Subject:	Electron microscopy - Technique.; High temperature superconductors. -
Online resource:	http://dx.doi.org/10.1017/CBO9780511534829Click here to view book
ISBN:	9780511534829 (electronic bk.)

Characterization of High Tc Materials and Devices by Electron Microscopy.
Browning, Nigel D.

Characterization of High Tc Materials and Devices by Electron Microscopy.[electronic resource]. - Cambridge :Cambridge University Press,2000. - 407 p.

Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors

This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

Electronic reproduction.

Available via World Wide Web.

Mode of access: World Wide Web.

ISBN: 9780511534829 (electronic bk.)Subjects--Topical Terms:

1897980
Electron microscopy - Technique.; High temperature superconductors.
Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: QC611.98.H54 C43 2000eb

Dewey Class. No.: 537.623

Characterization of High Tc Materials and Devices by Electron Microscopy.
LDR:02315nmm a22003013u 4500 001 1808691
003 AU-PeEL
005 20090601202841.0
006 m d
007 cr mn---------
008 231221t2000 ||| s |||||||eng|d
020 $a 9780511534829 (electronic bk.)
020 $a 9780521554909 (print)
035 $a EBL201990
035 $a EBL201990
035 $a 1808691
040 $a AU-PeEL $c AU-PeEL $d AU-PeEL
050 0 0 $a QC611.98.H54 C43 2000eb
082 0 0 $a 537.623
100 1 $a Browning, Nigel D. $3 863675
245 1 0 $a Characterization of High Tc Materials and Devices by Electron Microscopy. $h [electronic resource].
260 $a Cambridge : $b Cambridge University Press, $c 2000.
300 $a 407 p.
505 0 $a Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors
505 8 $a 9 Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O710 Grain boundaries in high T materials: transport properties and structure; 11 The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7-Delta; 12 Microstructures in superconducting YBa2Cu3O7 thin films; 13 Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron...; 14 Controlling the structure and properties of high T thin-film dev
520 $a This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
533 $a Electronic reproduction. $n Available via World Wide Web.
538 $a Mode of access: World Wide Web.
650 4 $a Electron microscopy - Technique.; High temperature superconductors. $3 1897980
655 7 $a Electronic books. $2 lcsh $3 542853
700 1 $a Pennycook, Stephen J. $3 863676
710 2 $a Ebooks Corporation. $3 1314793
776 1 $z 9780521554909
856 4 0 $z Click here to view book $u http://dx.doi.org/10.1017/CBO9780511534829