晶粒選擇測試機制設計之三維堆疊晶片測試應用 = = Die Selec...
葉智翔

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  • 晶粒選擇測試機制設計之三維堆疊晶片測試應用 = = Die Selection Test Mechanism Design for 3D-SICs Testing Applications /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: 晶粒選擇測試機制設計之三維堆疊晶片測試應用 = / 葉智翔撰
    Reminder of title: Die Selection Test Mechanism Design for 3D-SICs Testing Applications /
    remainder title: Die Selection Test Mechanism Design for 3D-SICs Testing Applications
    Author: 葉智翔
    other author: 許鈞瓏
    Published: [花蓮縣壽豐鄉] : [國立東華大學電機工程學系], : 2012[民101],
    Description: 7,79面 : 圖,表 ; 30公分
    Notes: 指導教授:許鈞瓏,林群傑
    Online resource: http://134.208.29.93/cgi-bin/cdrfb3/gsweb.cgi?ccd=xZ3ZHR&o=e2&dbid=I%2B3%3D%3C19%2A%3A%212&dbpathf=/opt/cdrfb3/db/stdcdrf/&fuid=01&dbna=
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  • 1 records • Pages 1 •
 
GE0128172 五樓論文區 (5F Theses & Dissertations) 03.不外借_N 本校碩士論文 T 448.6 4488 2012 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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