Oppolzer, Helmut.
Overview
Works: | 1 works in 0 publications in 0 languages |
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Titles
Particle beam microanalysis : = fundamentals, methods, and applications /
by:
Oppolzer, Helmut.; Rehme, Hans.; Fuchs, Ekkehard.
(Language materials, printed)
Analytical techniques for the characterization of compound semiconductors : = proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /
by:
Bastard, Gerald.; Oppolzer, Helmut.; Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors ((1990 :)
(Language materials, printed)