International Test Conference (1987 :)
概要
| 作品: | 5 作品在 0 項出版品 0 種語言 | |
|---|---|---|
書目資訊
Integration of test with design and manufacturing : = September 1, 2, 3, 1987, Sheraton Washington Hotel, Washington, D.C. /
by:
IEEE Computer Society., Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers., Philadelphia Section.; International Test Conference (1987 :)
(書目-語言資料,印刷品)