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Grasser, Tibor.

Overview

Works:	0 works in 3 publications in 1 languages

Titles

Hot carrier degradation in semiconductor devices by: Grasser, Tibor.; SpringerLink (Online service) (Electronic resources)

Noise in nanoscale semiconductor devices by: Grasser, Tibor.; SpringerLink (Online service) (Electronic resources)

Bias temperature instability for devices and circuits by: Grasser, Tibor.; SpringerLink (Online service) (Electronic resources)

Subjects

Semiconductors. Electronics and Microelectronics, Instrumentation. Metal oxide semiconductor field-effect transistors. Circuits and Systems. Engineering. Semiconductors- Noise. Quality Control, Reliability, Safety and Risk. Hot carriers. Electronic Circuits and Devices.

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