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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits/ Michael L. Bushnell, Vishwani D. Agrawal.
Author:	Bushnell, Michael L.
other author:	Agrawal, Vishwani D.
Published:	Boston :Kluwer Academic, : c2002.,
Description:	xviii, 690 p. :ill., digital ;26 cm.
Series:	Frontiers in electronic testing ;
Contained By:	Springer e-books
Subject:	Digital integrated circuits - Testing. -
Online resource:	http://dx.doi.org/10.1007/b117406
ISBN:	9780306470400 (electronic bk.)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Bushnell, Michael L.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits[electronic resource] /Michael L. Bushnell, Vishwani D. Agrawal. - Boston :Kluwer Academic,c2002. - xviii, 690 p. :ill., digital ;26 cm. - Frontiers in electronic testing ;17.

ISBN: 9780306470400 (electronic bk.)Subjects--Topical Terms:

752574
Digital integrated circuits
--Testing.

LC Class. No.: TK7874.75 / .B87 2002

Dewey Class. No.: 621.395

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
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020 $a 9780792379911 (paper)
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100 1 $a Bushnell, Michael L. $3 1072926
245 1 0 $a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits $h [electronic resource] / $c Michael L. Bushnell, Vishwani D. Agrawal.
260 $a Boston : $c c2002. $b Kluwer Academic,
300 $a xviii, 690 p. : $b ill., digital ; $c 26 cm.
440 0 $a Frontiers in electronic testing ; $v 17
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650 0 $a Mixed signal circuits $x Testing. $3 752575
650 0 $a Semiconductor storage devices $x Testing. $3 752576
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