Language:
English
繁體中文
Help
回圖書館首頁
手機版館藏查詢
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
Power-constrained testing of VLSI ci...
~
Al-Hashimi, Bashir.
Linked to FindBook
Google Book
Amazon
博客來
Power-constrained testing of VLSI circuits
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Power-constrained testing of VLSI circuits/ by Nicola Nicolici and Bashir M. Al-Hashimi.
Author:
Nicolici, Nicola.
other author:
Al-Hashimi, Bashir.
Published:
Boston :Springer Science + Business Media, : c2004.,
Description:
xi, 178 p. :ill., digital ;25 cm.
Series:
Frontiers in electronic testing ;
Contained By:
Springer e-books
Subject:
Integrated circuits, Very large scale integration - Protection. -
Online resource:
http://dx.doi.org/10.1007/b105922
ISBN:
9780306487316 (electronic bk.)
Power-constrained testing of VLSI circuits
Nicolici, Nicola.
Power-constrained testing of VLSI circuits
[electronic resource] /by Nicola Nicolici and Bashir M. Al-Hashimi. - Boston :Springer Science + Business Media,c2004. - xi, 178 p. :ill., digital ;25 cm. - Frontiers in electronic testing ;22.
ISBN: 9780306487316 (electronic bk.)Subjects--Topical Terms:
1005099
Integrated circuits, Very large scale integration
--Protection.
LC Class. No.: TK7874.75 / .N53 2004
Dewey Class. No.: 621.3950287
Power-constrained testing of VLSI circuits
LDR
:00740nam 2200229 a 45
001
844184
003
GreenPo
005
20100602
006
m d
007
cr nn 008maaau
008
100602s2004 mau j eng d
020
$a
9780306487316 (electronic bk.)
020
$a
9781402072352 (paper)
035
$a
978-1-4020-7235-2
050
0 0
$a
TK7874.75
$b
.N53 2004
082
0 0
$a
621.3950287
$2
21
100
1
$a
Nicolici, Nicola.
$3
832268
245
1 0
$a
Power-constrained testing of VLSI circuits
$h
[electronic resource] /
$c
by Nicola Nicolici and Bashir M. Al-Hashimi.
260
$a
Boston :
$c
c2004.
$b
Springer Science + Business Media,
300
$a
xi, 178 p. :
$b
ill., digital ;
$c
25 cm.
440
0
$a
Frontiers in electronic testing ;
$v
22
650
0
$a
Integrated circuits, Very large scale integration
$v
Protection.
$3
1005099
650
0
$a
Integrated circuits, Very large scale integration
$v
Testing.
$3
1005100
650
0
$a
Semiconductors
$x
Thermal properties.
$3
668415
700
1
$a
Al-Hashimi, Bashir.
$3
832267
710
2
$a
SpringerLink (Online service)
$3
836513
773
0
$t
Springer e-books
856
4 0
$u
http://dx.doi.org/10.1007/b105922
950
$a
Engineering
based on 0 review(s)
Location:
ALL
電子資源
Year:
Volume Number:
Items
1 records • Pages 1 •
1
Inventory Number
Location Name
Item Class
Material type
Call number
Usage Class
Loan Status
No. of reservations
Opac note
Attachments
W9063980
電子資源
11.線上閱覽_V
電子書
EB W9063980
一般使用(Normal)
On shelf
0
1 records • Pages 1 •
1
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login