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Lifetime Spectroscopy = A Method of ...
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Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Lifetime Spectroscopy/ by Stefan Rein.
Reminder of title:
A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Author:
Rein, Stefan.
Published:
Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2005.,
Description:
xxvi, 489 p. :ill., digital ;25 cm.
Series:
Springer Series in Material Science,
Contained By:
Springer e-books
Subject:
Silicon crystals - Defects. -
Online resource:
http://dx.doi.org/10.1007/3-540-27922-9http://dx.doi.org/10.1007/3-540-27922-9
ISBN:
9783540253037 (paper)
Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Rein, Stefan.
Lifetime Spectroscopy
A Method of Defect Characterization in Silicon for Photovoltaic Applications /[electronic resource] :by Stefan Rein. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005. - xxvi, 489 p. :ill., digital ;25 cm. - Springer Series in Material Science,850933-033X ;.
ISBN: 9783540253037 (paper)Subjects--Topical Terms:
897961
Silicon crystals
--Defects.
LC Class. No.: TK7871.15.S55 / R45 2005
Dewey Class. No.: 537
Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /
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A Method of Defect Characterization in Silicon for Photovoltaic Applications /
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by Stefan Rein.
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2005.
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xxvi, 489 p. :
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ill., digital ;
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25 cm.
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Springer Series in Material Science,
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0933-033X ;
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Silicon crystals
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Silicon crystals
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Physics and Astronomy (Springer-11651; ZDB-2-PHA)
based on 0 review(s)
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