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High performance memory testing = design principles, fault modeling, and self-test /

Record Type:	Electronic resources : Monograph/item
Title/Author:	High performance memory testing/ R. Dean Adams.
Reminder of title:	design principles, fault modeling, and self-test /
Author:	Adams, R. Dean.
Published:	Boston :Kluwer Academic, : c2003.,
Description:	xiii, 246 p. :ill. ;25 cm.
Series:	Frontiers in electronic testing
Subject:	Computer storage devices - Testing. -
Online resource:	https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=99367An electronic book accessible through the World Wide Web; click for information
ISBN:	0306479729 (electronic bk.)

High performance memory testing = design principles, fault modeling, and self-test /
Adams, R. Dean.

High performance memory testingdesign principles, fault modeling, and self-test /[electronic resource] :R. Dean Adams. - Boston :Kluwer Academic,c2003. - xiii, 246 p. :ill. ;25 cm. - Frontiers in electronic testing.

Includes bibliographical references (p. [229]-239) and index.

Electronic reproduction.
Boulder, Colo. :
NetLibrary,
2004.

Available via World Wide Web.

ISBN: 0306479729 (electronic bk.)Subjects--Topical Terms:

817078
Computer storage devices
--Testing.Index Terms--Genre/Form:

542853
Electronic books.

LC Class. No.: TK7895.M4 / A27 2003eb

Dewey Class. No.: 621.39/732

High performance memory testing = design principles, fault modeling, and self-test /
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003 OCoLC
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035 $a ocm53984211
035 $a 729531
040 $a N $c N $d OCLCQ
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050 1 4 $a TK7895.M4 $b A27 2003eb
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100 $a Adams, R. Dean. $3 817077
245 1 0 $a High performance memory testing $h [electronic resource] : $b design principles, fault modeling, and self-test / $c R. Dean Adams.
260 $a Boston : $c c2003. $b Kluwer Academic,
300 $a xiii, 246 p. : $b ill. ; $c 25 cm.
440 0 $a Frontiers in electronic testing
504 $a Includes bibliographical references (p. [229]-239) and index.
533 $a Electronic reproduction. $b Boulder, Colo. : $c NetLibrary, $d 2004. $n Available via World Wide Web. $n Access may be limited to NetLibrary affiliated libraries.
650 $a Computer storage devices $x Testing. $3 817078
650 $a Semiconductor storage devices $x Testing. $3 752576
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710 $a NetLibrary, Inc. $3 542851
856 4 $3 Bibliographic record display $u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=99367 $z An electronic book accessible through the World Wide Web; click for information
994 $a 92 $b AMF