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System-on-chip test architectures : ...

Wang, Laung-Terng.

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System-on-chip test architectures : = nanometer design for testability /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	System-on-chip test architectures :/ edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
Reminder of title:	nanometer design for testability /
other author:	Wang, Laung-Terng.
Published:	Amsterdam ;Morgan Kaufmann Publishers, : c2008.,
Description:	xxxvi, 856 p. :ill. ;25 cm.
Series:	The Morgan Kaufmann series in systems on silicon
Subject:	Systems on a chip - Testing. -
Online resource:	http://www.loc.gov/catdir/toc/ecip0719/2007023373.htmlhttp://www.loc.gov/catdir/toc/ecip0719/2007023373.html
Online resource:	http://www.loc.gov/catdir/enhancements/fy0808/2007023373-d.htmlhttp://www.loc.gov/catdir/enhancements/fy0808/2007023373-d.html
ISBN:	9780123739735$b(hardcover : alk. paper) :

System-on-chip test architectures : = nanometer design for testability /
System-on-chip test architectures :nanometer design for testability /edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. - Amsterdam ;Morgan Kaufmann Publishers,c2008. - xxxvi, 856 p. :ill. ;25 cm. - The Morgan Kaufmann series in systems on silicon.

Includes bibliographical references and index.

ISBN: 9780123739735$b(hardcover : alk. paper) :NT$1071

LCCN: 2007023373Subjects--Topical Terms:

629091
Systems on a chip
--Testing.

LC Class. No.: TK7895.E42 / S978 2008

Dewey Class. No.: 621.39/5

System-on-chip test architectures : = nanometer design for testability /
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020 $a 9780123739735$b(hardcover : alk. paper) : $c NT$1071
020 $a 012373973X (hardcover : alk. paper)
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040 $a DLC $c DLC $d BAKER $d BTCTA $d YDXCP $d C#P $d DLC
050 0 0 $a TK7895.E42 $b S978 2008
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245 0 0 $a System-on-chip test architectures : $b nanometer design for testability / $c edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
260 $a Amsterdam ; $a Boston : $c c2008. $b Morgan Kaufmann Publishers,
300 $a xxxvi, 856 p. : $b ill. ; $c 25 cm.
440 4 $a The Morgan Kaufmann series in systems on silicon
504 $a Includes bibliographical references and index.
650 $a Systems on a chip $x Testing. $3 629091
650 $a Integrated circuits $x Very large scale integration $x Testing. $3 629092
650 $a Integrated circuits $x Very large scale integration $x Design. $3 629093
700 $a Wang, Laung-Terng. $3 629088
700 $a Stroud, Charles E. $3 629089
700 $a Touba, Nur A. $3 629090
856 4 1 $3 Table of contents only $u http://www.loc.gov/catdir/toc/ecip0719/2007023373.html $z http://www.loc.gov/catdir/toc/ecip0719/2007023373.html
856 4 2 $3 Publisher description $u http://www.loc.gov/catdir/enhancements/fy0808/2007023373-d.html $z http://www.loc.gov/catdir/enhancements/fy0808/2007023373-d.html