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Ellipsometry of functional organic s...

Hinrichs, Karsten.

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Ellipsometry of functional organic surfaces and films

Record Type:	Electronic resources : Monograph/item
Title/Author:	Ellipsometry of functional organic surfaces and films/ edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
other author:	Hinrichs, Karsten.
Published:	Cham :Springer International Publishing : : 2018.,
Description:	xxvi, 547 p. :digital ;24 cm.
[NT 15003449]:	Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.
Contained By:	Springer eBooks
Subject:	Ellipsometry. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-75895-4
ISBN:	9783319758954

Ellipsometry of functional organic surfaces and films
Ellipsometry of functional organic surfaces and films[electronic resource] /edited by Karsten Hinrichs, Klaus-Jochen Eichhorn. - 2nd ed. - Cham :Springer International Publishing :2018. - xxvi, 547 p. :digital ;24 cm. - Springer series in surface sciences,v.520931-5195 ;. - Springer series in surface sciences ;v.52..

Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

ISBN: 9783319758954

Standard No.: 10.1007/978-3-319-75895-4doiSubjects--Topical Terms:

674275
Ellipsometry.

LC Class. No.: QC443 / .E455 2018

Dewey Class. No.: 535.52

Ellipsometry of functional organic surfaces and films
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245 0 0 $a Ellipsometry of functional organic surfaces and films $h [electronic resource] / $c edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
250 $a 2nd ed.
260 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2018.
300 $a xxvi, 547 p. : $b digital ; $c 24 cm.
490 1 $a Springer series in surface sciences, $x 0931-5195 ; $v v.52
505 0 $a Indtroduction -- Ellipsometry: A survey of Concept -- Biomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared spectroscopic methods for characterization of thin organic films -- Brillant infrared light sources for micro-ellipsometric studies of organic films -- Optical constants.
520 $a This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
650 0 $a Ellipsometry. $3 674275
650 0 $a Surfaces (Technology) $3 652796
650 1 4 $a Physics. $3 516296
650 2 4 $a Surface and Interface Science, Thin Films. $3 1244633
650 2 4 $a Surfaces and Interfaces, Thin Films. $3 892408
650 2 4 $a Physical Chemistry. $3 890828
650 2 4 $a Optics, Lasers, Photonics, Optical Devices. $3 2209850
650 2 4 $a Characterization and Evaluation of Materials. $3 890988
700 1 $a Hinrichs, Karsten. $3 2055683
700 1 $a Eichhorn, Klaus-Jochen. $3 2055684
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
830 0 $a Springer series in surface sciences ; $v v.52. $3 3332770
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-75895-4
950 $a Physics and Astronomy (Springer-11651)