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Scanning probe microscopy = atomic f...

Voigtlander, Bert.

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Scanning probe microscopy = atomic force microscopy and scanning tunneling microscopy /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Scanning probe microscopy/ by Bert Voigtlander.
Reminder of title:	atomic force microscopy and scanning tunneling microscopy /
Author:	Voigtlander, Bert.
Published:	Berlin, Heidelberg :Springer Berlin Heidelberg : : 2015.,
Description:	xv, 382 p. :ill. (some col.), digital ;24 cm.
[NT 15003449]:	Introduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom.
Contained By:	Springer eBooks
Subject:	Scanning probe microscopy. -
Online resource:	http://dx.doi.org/10.1007/978-3-662-45240-0
ISBN:	9783662452400 (electronic bk.)

Scanning probe microscopy = atomic force microscopy and scanning tunneling microscopy /
Voigtlander, Bert.

Scanning probe microscopyatomic force microscopy and scanning tunneling microscopy /[electronic resource] :by Bert Voigtlander. - Berlin, Heidelberg :Springer Berlin Heidelberg :2015. - xv, 382 p. :ill. (some col.), digital ;24 cm. - NanoScience and technology,1434-4904. - NanoScience and technology..

Introduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom.

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

ISBN: 9783662452400 (electronic bk.)

Standard No.: 10.1007/978-3-662-45240-0doiSubjects--Topical Terms:

603213
Scanning probe microscopy.

LC Class. No.: QH212.S33

Dewey Class. No.: 502.82

Scanning probe microscopy = atomic force microscopy and scanning tunneling microscopy /
LDR:02640nmm a2200337 a 4500 001 1995196
003 DE-He213
005 20150915111514.0
006 m d
007 cr nn 008maaau
008 151019s2015 gw s 0 eng d
020 $a 9783662452400 (electronic bk.)
020 $a 9783662452394 (paper)
024 7 $a 10.1007/978-3-662-45240-0 $2 doi
035 $a 978-3-662-45240-0
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.S33
072 7 $a TBN $2 bicssc
072 7 $a TEC027000 $2 bisacsh
072 7 $a SCI050000 $2 bisacsh
082 0 4 $a 502.82 $2 23
090 $a QH212.S33 $b V894 2015
100 1 $a Voigtlander, Bert. $3 2134506
245 1 0 $a Scanning probe microscopy $h [electronic resource] : $b atomic force microscopy and scanning tunneling microscopy / $c by Bert Voigtlander.
260 $a Berlin, Heidelberg : $b Springer Berlin Heidelberg : $b Imprint: Springer, $c 2015.
300 $a xv, 382 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a NanoScience and technology, $x 1434-4904
505 0 $a Introduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom.
520 $a This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
650 0 $a Scanning probe microscopy. $3 603213
650 0 $a Atomic force microscopy. $3 587940
650 0 $a Scanning tunneling microscopy. $3 587941
650 1 4 $a Materials Science. $3 890867
650 2 4 $a Nanotechnology. $3 526235
650 2 4 $a Nanotechnology and Microengineering. $3 1005737
650 2 4 $a Condensed Matter Physics. $3 1067080
710 2 $a SpringerLink (Online service) $3 836513
773 0 $t Springer eBooks
830 0 $a NanoScience and technology. $3 1567468
856 4 0 $u http://dx.doi.org/10.1007/978-3-662-45240-0
950 $a Chemistry and Materials Science (Springer-11644)