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Reliability and yield of semiconduct...

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National Tsing Hua University.

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Reliability and yield of semiconductor products /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Reliability and yield of semiconductor products // Way Kuo.
remainder title:	半導體產品可靠度與良率.
Author:	Kuo, Way.
Published:	Taiwan :National Tsing Hua University, : 2000.,
Description:	136 p. :ill. ;30 cm.
Notes:	"National Tsing Hua University, December 10-15, 2000."
Series:	TSMC lectureship 2000.
Subject:	Semiconductors. -

Reliability and yield of semiconductor products /
Kuo, Way.

Reliability and yield of semiconductor products /半導體產品可靠度與良率.Way Kuo. - Taiwan :National Tsing Hua University,2000. - 136 p. :ill. ;30 cm. - TSMC lectureship 2000..

"National Tsing Hua University, December 10-15, 2000."

Includes bibliographical references.Subjects--Topical Terms:

516162
Semiconductors.

/ K96

Reliability and yield of semiconductor products /
LDR:00620nam _2200181a _450 001 600888
008 030807s2000 ch a 000010eng
020 $b (pbk.)
035 $a 00258273
040 $a NDHU $c NDHU $d NDHU
082 0 4 $6 21.38152 $b K96
100 $a Kuo, Way. $3 569707
245 1 0 $a Reliability and yield of semiconductor products / $c Way Kuo.
246 1 1 $a 半導體產品可靠度與良率.
260 0 $a Taiwan : $c 2000. $b National Tsing Hua University,
300 $a 136 p. : $b ill. ; $c 30 cm.
440 0 $a TSMC lectureship 2000.
500 $a "National Tsing Hua University, December 10-15, 2000."
504 $a Includes bibliographical references.
650 $a Semiconductors. $3 516162
710 $a National Tsing Hua University. $3 569706
740 $a 台積電講座 $e 半導體產品可靠度與良率

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1 records • Pages 1 •
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60003177

六樓西文書區HC-Z(6F Western Language Books)

01.外借(書)_YB

一般圖書

TK7871.85 K96 2000

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Borrow / Due date: 2026/03/16 23:59:59

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1 records • Pages 1 •
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