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X-ray and optical studies of electri...

Willis, Paula Christine.

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X-ray and optical studies of electric field-induced layer structure changes in surface stabilized ferroelectric liquid crystal cells.

Record Type:	Language materials, printed : Monograph/item
Title/Author:	X-ray and optical studies of electric field-induced layer structure changes in surface stabilized ferroelectric liquid crystal cells./
Author:	Willis, Paula Christine.
Description:	145 p.
Notes:	Director: Noel A. Clark.
Contained By:	Dissertation Abstracts International54-02B.
Subject:	Chemistry, Polymer. -
Online resource:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9318147

X-ray and optical studies of electric field-induced layer structure changes in surface stabilized ferroelectric liquid crystal cells.
Willis, Paula Christine.

X-ray and optical studies of electric field-induced layer structure changes in surface stabilized ferroelectric liquid crystal cells. - 145 p.

Director: Noel A. Clark.

Thesis (Ph.D.)--University of Colorado at Boulder, 1992.

Finally, we discuss the implications of defect observations near the A to C transition, and present several models for layer dislocation nucleation and some experiments to test those models.Subjects--Topical Terms:

1018428
Chemistry, Polymer.

X-ray and optical studies of electric field-induced layer structure changes in surface stabilized ferroelectric liquid crystal cells.
LDR:03618nam 2200325 a 45 001 969305
005 20110920
008 110921s1992 eng d
035 $a (UMI)AAI9318147
035 $a AAI9318147
040 $a UMI $c UMI
100 1 $a Willis, Paula Christine. $3 1293359
245 1 0 $a X-ray and optical studies of electric field-induced layer structure changes in surface stabilized ferroelectric liquid crystal cells.
300 $a 145 p.
500 $a Director: Noel A. Clark.
500 $a Source: Dissertation Abstracts International, Volume: 54-02, Section: B, page: 0917.
502 $a Thesis (Ph.D.)--University of Colorado at Boulder, 1992.
520 $a Finally, we discuss the implications of defect observations near the A to C transition, and present several models for layer dislocation nucleation and some experiments to test those models.
520 $a Surface Stabilized Ferroelectric Liquid Crystals (SSFLC's) are now under development for applications which include optical computing and large flat-screen computer displays. The electro-optic behavior of SSFLC cells is significantly affected by the smectic layer and molecular orientational configurations within the cell. Because an electric field is needed to use these cells, to understand their electro-optic behaviour, we must understand what happens to the layer structure in the presence of an electric field. This thesis describes X-ray and optical experiments determining the smectic layer structure and molecular responses of CS 1014 and ZLI 3654 SSFLC cells to DC and low frequency AC electric fields.
520 $a At the electric fields typically needed to optically switch SSFLC cells, a continuous, reversible, saturable change of the cell's optic axis has been observed. One model of this behavior proposed reversible smectic layer flexing in SSFLC cells. Our X-ray scattering and spectral transmission measurements indicate that a molecular director response, with unchanging smectic layers, causes this effect. We calculate the optic axis orientational dependence on applied voltage based on the molecular director model and compare it to experimental results. Additionally, we present theoretical arguments against elastic layer flattening in any typical SSFLC cell. The X-ray experiments also yielded the surprising evidence of local layering dislocations within the SSFLC cells examined to date.
520 $a At higher electric fields, we observe both elastic and plastic layer flexing in electrically driven cells using X-ray scattering; the layer flex changes from elastic to plastic as the incident X-ray intensity increased. All layer flexing appears to occur without an accompanying layer thickness change. This observation weakens previous claims of electric field driven SSFLC elastic layer flex based on X-ray measurements. Without X-rays, the final chevron tilt angle is proportional to the peak past applied electric field. We discuss possible causes for these phenomena.
520 $a We present the local layer structure of one electric-field induced line defect. The structure, confirmed via X-ray measurements, is that of a locally rotated, flattened chevron structure connected with continuously curving layers to the surrounding chevron. We discuss the electrostatic interactions and possible nucleation mechanisms for the defect.
590 $a School code: 0051.
650 4 $a Chemistry, Polymer. $3 1018428
650 4 $a Engineering, Electronics and Electrical. $3 626636
650 4 $a Physics, Condensed Matter. $3 1018743
690 $a 0495
690 $a 0544
690 $a 0611
710 2 0 $a University of Colorado at Boulder. $3 1019435
773 0 $t Dissertation Abstracts International $g 54-02B.
790 $a 0051
790 1 0 $a Clark, Noel A., $e advisor
791 $a Ph.D.
792 $a 1992
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=9318147