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Application of Non-Contact Electrost...

Raza, Hamza Ahmad,

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Application of Non-Contact Electrostatic Voltmeter for Solar Photovoltaic Device Characterization /

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Application of Non-Contact Electrostatic Voltmeter for Solar Photovoltaic Device Characterization // Hamza Ahmad Raza.
作者:	Raza, Hamza Ahmad,
面頁冊數:	1 electronic resource (137 pages)
附註:	Source: Dissertations Abstracts International, Volume: 84-11, Section: B.
Contained By:	Dissertations Abstracts International84-11B.
標題:	Electrical engineering. -
電子資源:	https://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30419755
ISBN:	9798379524425

Application of Non-Contact Electrostatic Voltmeter for Solar Photovoltaic Device Characterization /
Raza, Hamza Ahmad,

Application of Non-Contact Electrostatic Voltmeter for Solar Photovoltaic Device Characterization /Hamza Ahmad Raza. - 1 electronic resource (137 pages)

Source: Dissertations Abstracts International, Volume: 84-11, Section: B.

A photovoltaic (PV) module is a series and parallel connection of multiple PV cells; defects in any cell can cause module power to drop. Similarly, a photovoltaic system is a series and parallel connection of multiple modules, and any low-performing module in the PV system can decrease the system output power. Defects in a solar cell include, but not limited to, the presence of cracks, potential induced degradation (PID), delamination, corrosion, and solder bond degradation. State-of-the-art characterization techniques to identify the defective cells in a module and defective module in a string are i) Current-voltage (IV) curve tracing, ii) Electroluminescence (EL) imaging, and iii) Infrared (IR) imaging. Shortcomings of these techniques include i) unsafe connection and disconnection need to be made with high voltage electrical cables, and ii) labor and time intensive disconnection of the photovoltaic strings from the system.This work presents a non-contact characterization technique to address the above two shortcomings. This technique uses a non-contact electrostatic voltmeter (ESV) along with a probe sensor to measure the surface potential of individual solar cells in a commercial module and the modules in a string in both off-grid and grid-connected systems. Unlike the EL approach, the ESV setup directly measures the surface potential by sensing the electric field lines that are present on the surface of the solar cell.The off-grid testing of ESV on individual cells and multicells in crystalline silicon (cSi) modules and on individual cells in cadmium telluride (CdTe) modules and individual modules in a CdTe string showed less than 2% difference in open circuit voltage compared to the voltmeter values. In addition, surface potential mapping of the defective cracked cells in a multicell module using ESV identified the dark, grey, and bright areas of EL images precisely at the exact locations shown by the EL characterization.The on-grid testing of ESV measured the individual module voltages at maximum power point (Vmpp) and quantitatively identified the exact PID-affected module in the entire system. In addition, the poor-performing non-PID modules of a grid-connected PV system were also identified using the ESV technique.

English

ISBN: 9798379524425Subjects--Topical Terms:

649834
Electrical engineering.
Subjects--Index Terms:

Defect detection

Application of Non-Contact Electrostatic Voltmeter for Solar Photovoltaic Device Characterization /
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520 $a A photovoltaic (PV) module is a series and parallel connection of multiple PV cells; defects in any cell can cause module power to drop. Similarly, a photovoltaic system is a series and parallel connection of multiple modules, and any low-performing module in the PV system can decrease the system output power. Defects in a solar cell include, but not limited to, the presence of cracks, potential induced degradation (PID), delamination, corrosion, and solder bond degradation. State-of-the-art characterization techniques to identify the defective cells in a module and defective module in a string are i) Current-voltage (IV) curve tracing, ii) Electroluminescence (EL) imaging, and iii) Infrared (IR) imaging. Shortcomings of these techniques include i) unsafe connection and disconnection need to be made with high voltage electrical cables, and ii) labor and time intensive disconnection of the photovoltaic strings from the system.This work presents a non-contact characterization technique to address the above two shortcomings. This technique uses a non-contact electrostatic voltmeter (ESV) along with a probe sensor to measure the surface potential of individual solar cells in a commercial module and the modules in a string in both off-grid and grid-connected systems. Unlike the EL approach, the ESV setup directly measures the surface potential by sensing the electric field lines that are present on the surface of the solar cell.The off-grid testing of ESV on individual cells and multicells in crystalline silicon (cSi) modules and on individual cells in cadmium telluride (CdTe) modules and individual modules in a CdTe string showed less than 2% difference in open circuit voltage compared to the voltmeter values. In addition, surface potential mapping of the defective cracked cells in a multicell module using ESV identified the dark, grey, and bright areas of EL images precisely at the exact locations shown by the EL characterization.The on-grid testing of ESV measured the individual module voltages at maximum power point (Vmpp) and quantitatively identified the exact PID-affected module in the entire system. In addition, the poor-performing non-PID modules of a grid-connected PV system were also identified using the ESV technique.
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590 $a School code: 0010
650 4 $a Electrical engineering. $3 649834
650 4 $a Energy. $3 876794
650 4 $a Alternative energy. $3 3436775
653 $a Defect detection
653 $a Electroluminescence
653 $a Electrostatic voltmeter
653 $a IV curve
653 $a Solar photovoltaic device
690 $a 0544
690 $a 0791
690 $a 0363
710 2 $a Arizona State University. $b Electrical Engineering. $e degree granting institution. $3 3771820
720 1 $a Tamizhmani, Govindasamy $e degree supervisor.
720 1 $a Kiaei, Sayfe $e degree supervisor.
773 0 $t Dissertations Abstracts International $g 84-11B.
790 $a 0010
791 $a Ph.D.
792 $a 2023
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